Helium Depth Profile Measurements Within Tungsten Coatings By Using Glow Discharge Optical Emission Spectrometry (GDOES)

In the present paper results concerning the implementation of the Glow Discharge Optical Emission Spectrometry (GDOES) for measure the He depth profile within W coatings are given. The He emission line situated at 587.5 nm was used in this respect. W coating containing He up 10 at.% and with thickness of 5 μm have been obtained by Combined Magnetron Sputtering and Ion Implantation (CMSII) method. The coatings structure and morphology was investigated using Scanning Electron Microscopy (SEM) measurements. The He retention within the coatings was evaluated by using Thermal Desorption Spectroscopy (TDS). Time-of-Flight Elastic Recoil Detection Analysis (TOF ERDA) measurements has been used to determine chemical composition of the coatings. Results of TOF-ERDA measurements results were used to calibrate the GDOES equipment. Using these data the GDOES depth profiles of the He within W coatings have been obtained.

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